FALIT® Gel Laser Decapsulation, Semiconductor Failure Analysis Inspection Tool since 2004

FALIT® Gel Laser Decapsulation is a semiconductor failure analysis tool specializing in laser decapsulation for ICs, PCBs, and IGBTs.

FALIT® Laser Decapsulation Software Features – Image Templates

FALIT® Laser Decapsulation Software features image templates for visual positioning.

FALIT® Laser Decapsulation Software Features – Shape Tools

FALIT® Laser Decapsulation Software includes shape tools with a variety of available shapes.

FALIT® IC Laser Decapsulation System for Failure Analysis 2006

The FALIT® IC Laser Decapsulation System for failure analysis has been used since 2006 to reveal bonding wires and dies.