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FALIT® IC Laser Decapsulation System for Failure Analysis 2006

The FALIT® IC Laser Decapsulation System for failure analysis has been used since 2006 to reveal bonding wires and dies.

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FALIT® Gel Laser Decapsulation, Semiconductor Failure Analysis Inspection Tool since 2004

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InstaWeld® Solar Heater Welding | Non-contact Continuous Welding | Welding SS Copper Aluminum

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MedicalMark® – Precise rotary controlled laser marking catheter

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AutomotiveMark® – laser marking automotive engine titanium valves

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